PPT Slide

New for 2002: Fullpat (runs within MS-Excel)

By Steve Chipera and Dave Bish of Los Alamos National Laboratory, USA

http://www.ccp14.ac.uk/ccp/web-mirrors/fullpat/

Full profile non-Rietveld method using standards

Described in the IUCr Commission on Powder Diffraction Newsletter:

http://www.se.iucr.org/iucr-top/comm/cpd/Newsletters/no27jul2002/

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