Crystal Impact Home  
  About us Diamond Endeavour Match!  
About Match!
Function list...
Brochure...
References...
Get Match!

Order Now

Demo Version

If you are interested in evaluating MATCH!, you can download a time-limited demonstration version free-of-charge.
Support
Updates...
Frequently Asked Questions...
User Group...

Match! Function List

  • Fast single and multiple phase identification from powder diffraction data
  • Use the ICDD PDF-2 or PDF-4 databases and/or your own diffraction data or patterns calculated from crystal structure data (e.g. CIF files) in phase identification
  • Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
  • Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
  • Automatic residual searching with respect to identified phases
  • Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
  • Automatic optimization of peak searching sensitivity
  • Fitting of all (or selected) peak parameters to exp. profile data
  • Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
  • Semi-quantitative analysis (Reference Intensity Ratio method)
  • Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
  • Integrated database retrieval system and viewer for PDF and user datasheets
  • Multiple step undo/redo
  • Support for new PDF entry numbers (9 digits)
  • User-configurable automatic operation
  • Full parameter control with instant rearrangement of the results list
  • Automatic d-value shifting during search-match process (optionally)
  • Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
  • Comfortable graphical and tabular comparison of peak data and candidate patterns
  • Mouse-controlled pattern graphics zooming and tracking
  • User-configurable HTML-reports
  • Online update (automatic or manual)
  • Supported diffraction data file formats:
    • ASCII profile (start, step, intensities or 2 columns)
    • Bruker/Siemens raw data (old and new) (*.raw)
    • Bruker/Siemens DIFFRAC AT peak data (*.dif)
    • DBWS (*.rfl, *.dat)
    • ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
    • Inel raw data (*.dat)
    • Jade/MDI/SCINTAG raw data (*.mdi)
    • Philips/PANalytical peak data (*.udi)
    • Philips/PANalytical raw data (*.rd, *.udf)
    • Rigaku raw data (*.raw)
    • SCINTAG raw data (*.raw, *.rd)
    • Siemens (*.uxd)
    • Stoe raw data (*.raw)
    • Stoe peak data (*.pks)

    Please contact Crystal Impact if the file format you are using is not yet supported!

System requirements

  • Personal Computer with Microsoft Windows 98, ME, NT 4.0, 2000 or XP operating system
  • Reference pattern database (ICDD PDF-2 or PDF-4 (recommended)) and/or own powder diffraction patterns or crystal structure data (e.g. CIF files))
  • Microsoft Internet Explorer 5.01 or higher
  • 64 megabytes of RAM (128 megabytes recommended)
  • Hard disk with minimum 600 MB of free disk space
  • Graphics resolution of 1024 x 768 pixels with 32,768 colors ("High Color")